Testing and Design-for-Testability Solutions for 3D Integrated Circuits
Prof. Krishnendu Chakrabarty (Duke University, Durham, USA)
Despite the numerous benefits offered by 3D integration, testing remains a major obstacle that hinders its widespread adoption. Test techniques and design-for-testability (DfT) solutions for 3D ICs have remained largely unexplored in the research community, even though experts in industry have identified a number of test challenges related to the lack of probe access for wafers, test access to modules in stacked wafers/dies, thermal concerns, test economics, and new defects arising from unique processing steps such as wafer thinning, alignment, and bonding. In this talk, the speaker will present a number of testing and DfT challenges, and some of the solutions being advocated for these challenges. The speaker will focus on pre-bond TSV testing, DfT innovations related to the optimization of die wrappers, test scheduling, and access to dies and inter-die interconnects during post-bond (stack) testing.
Krishnendu Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively. He is now Professor of Electrical and Computer Engineering at Duke University. He is also a Chair Professor in Software Theory at Tsinghua University, Beijing, China. Prof. Chakrabarty is a recipient of the National Science Foundation Early Faculty (CAREER) award, the Office of Naval Research Young Investigator award, the Humboldt Research Fellowship from the Alexander von Humboldt Foundation, Germany, and several best papers awards at IEEE conferences. Prof. Chakrabarty's current research projects include: testing and design-for-testability of integrated circuits; digital microfluidics, biochips, and cyberphysical systems; optimization of digital print and production system infrastructure. He has authored 10 books on these topics (with two more books in press), published over 370 papers in journals and refereed conference proceedings, and given over 150 invited, keynote, and plenary talks. Prof. Chakrabarty is a Fellow of IEEE, a Golden Core Member of the IEEE Computer Society, and a Distinguished Engineer of ACM. He was a 2009 Invitational Fellow of the Japan Society for the Promotion of Science (JSPS). He is a recipient of the 2008 Duke University Graduate School Dean???s Award for excellence in mentoring, and the 2010 Capers and Marion McDonald Award for Excellence in Mentoring and Advising, Pratt School of Engineering, Duke University. He served as a Distinguished Visitor of the IEEE Computer Society during 2005-2007, and as a Distinguished Lecturer of the IEEE Circuits and Systems Society during 2006-2007. Currently he serves as an ACM Distinguished Speaker, as well as a Distinguished Visitor of the IEEE Computer Society for 2010-2012.